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Evaluation of Measurement Uncertainty for Absolute Flatness Measurement by Using Fizeau Interferometer with Phase-Shifting Capability

机译:使用具有相移能力的Fizeau干涉仪评估绝对平坦度的测量不确定度的评估

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It is important to precisely measure flatness of the optical flats, as many industries use these as reference standards to ensure the quality of precision measurements and fabricated components. This paper describes identification of sources of error and measurement uncertainty evaluation for three flat test. Three flat test is used for absolute flatness measurement of optical flats, with the help of Fizeau interferometer (VerifireXP/D, with phase shift interferometry) established recently at National Physical Laboratory, India (NPL-I). The absolute profile of reference flat with higher accuracy can be determined using liquid level reference but liquid flat reference is more difficult to realize practically. Therefore three flat test is frequently adopted in standard interferometric measurements and traceability of this test can also be established by using a traceable laser head. This paper describes three flat method in detail along with observations and evaluation of measurement uncertainty as per ISO GUM is also done. Factors contributing to uncertainty of measurement of surface flatness have been indentified and detailed evaluation of uncertainty in measurements has been reported here.
机译:精确测量光学平板的平坦度很重要,因为许多行业都将其用作参考标准,以确保精确测量和加工组件的质量。本文介绍了三种平面测试的误差源识别和测量不确定度评估。最近在印度国家物理实验室(NPL-1)建立的Fizeau干涉仪(VerifireXP / D,带相移干涉仪)的帮助下,将三平面测试用于光学平面的绝对平面度测量。可以使用液面基准来确定具有较高精度的基准平面的绝对轮廓,但实际上很难实现液面基准。因此,在标准干涉测量中经常采用三个平面测试,并且也可以通过使用可追踪的激光头来确定该测试的可追溯性。本文根据ISO GUM详细介绍了三种平坦的方法以及观察和测量不确定度的评估。已经确定了导致表面平整度测量不确定度的因素,并在此报告了测量不确定度的详细评估。

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