Mapping Rectangular Rock Thin Sections for Repeatable Electron Microprobe Analysis

摘要

Co-ordinate mapping provides a rapid, accurate and repeatable method of locating target points in rectangular rock thin sections for X-ray microanalysis with, for example, an electron microprobe. Each target point receives a permanent grid-reference coordinate measured relative to a fixed point on the thin section. Grid-reference points provide a permanent record of the location of target grains. Simple mathematic formulae are used to recalculate co-ordinate points at the start of each microprobe session that, when input into the microprobe, will bring the targeted area to the centre of the microprobe viewing screen where photomicrographs can be used for final identification. This method is applicable to other point analysis techniques that incorporate sample imaging and uses commercially available computer software programs; it is easily applied and is particularly beneficial for new and inexperienced microprobe users.