首页> 外文期刊>Metrology and Measurement Systems: Metrologia i Systemy Pomiarowe >APPROXIMATION OF THERMAL BACKGROUND APPLIED TO DEFECT DETECTION USING THE METHODS OF ACTIVE THERMOGRAPHY
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APPROXIMATION OF THERMAL BACKGROUND APPLIED TO DEFECT DETECTION USING THE METHODS OF ACTIVE THERMOGRAPHY

机译:主动热成像方法在缺陷检测中的热背景近似

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摘要

In the paper a method for correction of heating non-homogeneity applied in defect detection with the use of active thermography is presented. In the method an approximation of thermal background with second- and third -order surfaces was used, what made it possible to remove partially the background. In the paper the simulation results obtained with the abovementioned method are presented. An analysis of the influence of correction of heating non-homogeneity on the effectiveness of defect detection is also carried out. The simulations are carried out for thermograms obtained on the basis of experiments on a test sample with simulated defects, made of a material of low thermal diffusivity.
机译:在本文中,提出了一种利用主动热成像技术校正缺陷检测中的加热不均匀性的方法。在该方法中,使用了具有二阶和三阶表面的热本底近似值,从而可以部分去除本底。本文介绍了用上述方法获得的仿真结果。还进行了加热不均匀性的校正对缺陷检测的有效性的影响的分析。对具有热缺陷率低的材料制成的具有模拟缺陷的测试样品,根据实验获得的热分析图进行模拟。

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