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Primary ultrasonic interferometer photodiode characterization using frequency-modulated laser wavefront radiation

机译:调频激光波前辐射对初级超声干涉仪光电二极管的表征

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摘要

Photodiodes play an important role in many optical systems and, as such, their stability and performance are of great importance. Manufacturers of such detectors typically only provide information regarding their sensitivity as a function of the optical wavelength and this is often sufficient for applications such as telecommunications. However, in certain applications such as primary ultrasonic standards based on interferometry, the frequency response of the photodiodes is of critical importance because, for accurate calibration, a correction factor must be applied, which contributes a major source of measurement uncertainty. Most optical calibration systems reported in the literature operate either in the GHz range or a very limited MHz range. This work reports on the development of a system based on rotational optical components that produces light patterns scanned through a slit at varying speeds using different deflection mechanisms. This results in the generation of spatially dependent interference fringes in the range 1 Hz up to 115 MHz with an expanded uncertainty of less than 5% for the majority of its frequency range of operation.
机译:光电二极管在许多光学系统中起着重要的作用,因此,其稳定性和性能非常重要。这样的检测器的制造商通常仅提供关于其灵敏度的信息,该灵敏度是光波长的函数,这对于诸如电信之类的应用通常是足够的。但是,在某些应用中,例如基于干涉测量的主要超声标准,光电二极管的频率响应至关重要,因为对于精确校准,必须应用校正因子,这是造成测量不确定度的主要来源。文献中报道的大多数光学校准系统都在GHz范围内或非常有限的MHz范围内运行。这项工作报告了基于旋转光学组件的系统的开发,该光学组件使用不同的偏转机制以可变的速度产生通过狭缝扫描的光图案。这导致产生在1 Hz至115 MHz范围内的空间相关干扰条纹,在其大部分工作频率范围内,不确定度均小于5%。

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