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NPL scales for radiance factor and total diffuse reflectance

机译:NPL标度用于辐射因子和总漫反射率

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摘要

The National Reference Reflectometer has been developed by the National Physical Laboratory (NPL) to realize scales for radiance factor and total diffuse reflectance, the latter scale being obtained through the spatial integration of goniometric measurements of reflectance. Analysis of its performance in the spectral region from 400 nm to 1000 nm shows that for spectrally neutral white materials such as matte white tiles and Spectralon~(TM) plaques the instrument is capable of realizing 0/45 radiance factor measurements with an uncertainty of 0.2% (k=2) and 0/d total diffuse reflectance measurements with an uncertainty of approximately 0.25% (k=2). The uncertainties depend on the variation of reflectance with angle, and there will therefore be some dependence on the material being measured. This instrument is now used to establish UK diffuse reflectance scales in the visible part of the spectrum.
机译:国家参考反射仪是由美国国家物理实验室(NPL)开发的,用于实现辐射系数和总漫反射率的标度,后者是通过对反射率的角度测量法进行空间积分而获得的。分析其在400 nm至1000 nm光谱范围内的性能,结果表明,对于光谱中性的白色材料(例如无光泽的白色瓷砖和Spectralon〜™斑块),该仪器能够实现0/45辐射因子测量,不确定度为0.2 %(k = 2)和0 / d总漫反射率测量值,不确定度约为0.25%(k = 2)。不确定性取决于反射率随角度的变化,因此对被测材料会有一定的依赖性。现在,该仪器用于在光谱的可见光部分建立UK漫反射比例。

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