首页> 外文期刊>Metallurgical and Materials Transactions, A. Physical Metallurgy and Materials Science >Tail Departure of Log-Normal Grain Size Distributions in Synthetic Three-Dimensional Microstructures
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Tail Departure of Log-Normal Grain Size Distributions in Synthetic Three-Dimensional Microstructures

机译:合成三维微观结构中对数正态晶粒尺寸分布的尾部偏离

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摘要

Polycrystalline materials are generally thought to have grain size distributions that correspond to log-normal. Statistical volume elements can use such geometric shape distributions to simulate single-phase polycrystals. When the log-normal distribution is used for grain size, however, it can give rise to nonphysical large grains that cannot be practically accommodated in finite simulation volumes. The application of other distributions that afford better control of the upper tails, e.g., truncated distributions, resolves the problem and allows more representative distributions to be generated. These points are illustrated with an example of generation of a synthetic three-dimensional (3-D) microstructure to represent the nickel-based superalloy Inconel 100, which exhibits significant upper tail departure from log-normal. Twin insertion, to represent annealing twins, will also be discussed.
机译:通常认为多晶材料具有对应于对数正态的晶粒尺寸分布。统计体积元素可以使用这种几何形状分布来模拟单相多晶。但是,当将对数正态分布用于晶粒尺寸时,它会引起非物理大晶粒,而这些晶粒实际上无法容纳在有限的模拟体积中。施加能够更好地控制上尾巴的其他分布(例如,截短的分布)可以解决该问题,并可以生成更具代表性的分布。用合成的三维(3-D)微结构的生成示例说明了这些点,以表示镍基超合金Inconel 100,该合金的上尾部显着偏离对数正态。将讨论代表退火孪晶的孪晶插入。

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