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Microstructural development and mechanical properties of a near-eutectic directionally solidified Sn-Bi solder alloy

机译:接近共晶的定向凝固Sn-Bi焊料合金的显微组织发展和力学性能

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摘要

Sn-Bi solders may be applied for electronic applications where low-temperature soldering is required, i.e., sensitive components, step soldering and soldering LEDs. In spite of their potential to cover such applications, the mechanical response of soldered joints of Sn-Bi alloys in some cases does not meet the strength requirements due to inappropriate resulting microstructures. Hence, careful examination and control of as-soldered microstructures become necessary with a view to pre-programming reliable final properties. The present study aims to investigate the effects of solidification thermal parameters (growth rate VI, and cooling rate TO on the microstructure of the Sn-52 wt%Bi solder solidified under unsteady-state conditions. Samples were obtained by upward directional solidification (DS), followed by characterization through metallography and scanning electron microscopy (SEM). The microstructures are shown to be formed by Sn-rich dendrites decorated with Bi precipitates surrounded by a complex regular eutectic mixture, with alternated Bi-rich and Sn-rich phases. Experimental correlations of primary (lambda(1)), secondary (lambda(2)), tertiary (lambda(3)) dendritic and eutectic spacings (lambda(coarse) and lambda(fine)) with cooling rate and growth rate are established. Two ranges of lamellar eutectic sizes were determined, described by two experimental equations lambda = 1.1 V-L(-1/2) and lambda = 0.67 V-L(-1/2). The onset of tertiary branches within the dendritic array along the Sn-52 wt.%Bi alloy DS casting is shown to occur for cooling rates lower than 1.5 degrees C/s. (C) 2015 Elsevier Inc. All rights reserved.
机译:Sn-Bi焊料可用于需要低温焊接的电子应用,即敏感组件,分步焊接和LED焊接。尽管它们具有覆盖此类应用的潜力,但由于生成的不适当的微观结构,Sn-Bi合金焊接接头的机械响应在某些情况下仍无法满足强度要求。因此,为了预编程可靠的最终性能,必须仔细检查和控制焊接后的微结构。本研究旨在研究凝固热参数(生长速率VI和冷却速率TO)对在非稳态条件下凝固的Sn-52 wt%Bi焊料的微观结构的影响,并通过向上定向凝固(DS)获得样品,然后通过金相和扫描电子显微镜(SEM)进行表征,显示出微观结构是由富含Bi析出物的富Sn树枝晶形成的,Bi析出物由复杂的规则共晶混合物包围,Bi和富Sn交替出现。建立了主要(lambda(1)),次要(lambda(2)),第三(lambda(3))树状和共晶间距(lambda(粗)和lambda(fine))与冷却速率和增长率的相关性。两个确定了层状共晶尺寸的范围,由两个实验方程式lambda = 1.1 VL(-1/2)和lambda = 0.67 VL(-1/2)来描述。沿Sn-52 wt 。%Bi合金DS铸件的冷却速度低于1.5摄氏度/秒。 (C)2015 Elsevier Inc.保留所有权利。

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