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首页> 外文期刊>Materials transactions >Characterization of Gallium-induced Intergranular Fracture Surface and the Auger Electron Spectroscopic Analysis for Mg Grain Boundary Segregation in AA6061 T4 Al-Mg-Si Alloy
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Characterization of Gallium-induced Intergranular Fracture Surface and the Auger Electron Spectroscopic Analysis for Mg Grain Boundary Segregation in AA6061 T4 Al-Mg-Si Alloy

机译:AA6061 T4 Al-Mg-Si合金中镓诱导的晶界断裂表面表征及镁晶粒边界偏析的俄歇电子能谱分析

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摘要

This investigation examines the grain boundary segregation of Mg and Si in AA6061-T4 alloy, using Auger electron spectroscopy technology. Liquid metal embrittlement by gallium was conducted to fracture the AA6061-T4 alloy intergranularty to obtain compositional information directly from the grain boundary facets. The amount of liquid gallium applied is controlled to break the alloy intergranularly at room temperature, importantly without Ga-bearing particles or a film covering the fracture surface. The method of generating a fully intergranular fracture surface for AA6061 is elucidated. The AES analysis reveals that Mg in 6061 T4 alloy is segregated at grain boundaries, but Si does not. The segregation of Mg depends on the rolling direction. The mean peak-to-peak ratio I_(Mg)/I_(Al) of the specimen whose longitudinal axis is perpendicular to the rolling direction is about three times that of the specimen whose axis parallel thereto. The grain boundary segregation is not result oxidation-induced; surface segregation also makes no contribution.
机译:本研究使用俄歇电子能谱技术研究了Aa6061-T4合金中Mg和Si的晶界偏析。用镓进行的液态金属脆化使AA6061-T4合金的晶间断裂,从而直接从晶界刻面获得成分信息。控制液态镓的施加量以在室温下使合金沿晶界断裂,重要的是没有含Ga的颗粒或覆盖断裂表面的薄膜。阐明了生成AA6061的全晶间断裂面的方法。 AES分析显示6061 T4合金中的Mg偏析在晶界处,而Si则不偏析。 Mg的偏析取决于轧制方向。纵向轴垂直于轧制方向的试样的平均峰峰比I_(Mg)/ I_(Al)约为平行于试样轧制方向的试样的三倍。晶界偏析不会导致氧化诱导;表面隔离也无济于事。

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