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Lorentz microscopy observation of magnetic domain structure variation in NiFe/Au multilayer films caused by Au layer thickness

机译:Lorentz显微镜观察由Au层厚度引起的NiFe / Au多层膜的磁畴结构变化

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摘要

Lorentz electron microscopy offers a very useful technique by which the magnetic domain structure of a thin film can be observed. In order to develop GMR materials with high sensitivity, it is desirable to understand the magnetic domain structure of the material. In this study, the magnetic domain structure of a series of NiFe/Au multilayer films (MLFs) with Au layer thickness between 1 nm and 4 nm has been observed using Lorentz microscopy. The MLFs showed a complicated domain structure, which contained twin walls and cross-tie walls in the MLFs. As the Au layer thickness increased so the ferromagnetic coupling between the NiFe layers decreased resulting in a more complex domain structure. In-situ magnetizing experiments showed that magnetic domain wall motion was the dominant mechanism for reversing the direction of magnetization. It is believed that reversal of the magnetization in the MLFs with thick Au layers was greatly affected by the structural defects in the films.
机译:洛伦兹电子显微镜提供了一种非常有用的技术,通过该技术可以观察薄膜的磁畴结构。为了开发具有高灵敏度的GMR材料,期望了解材料的磁畴结构。在这项研究中,使用Lorentz显微镜观察到了一系列金层厚度在1 nm至4 nm之间的NiFe / Au多层膜(MLF)的磁畴结构。多边基金显示了一个复杂的域结构,在多边基金中包含双壁和交叉结壁。随着Au层厚度的增加,NiFe层之间的铁磁耦合降低,从而导致更复杂的畴结构。原位磁化实验表明,磁畴壁运动是反转磁化方向的主要机制。据信,具有厚的Au层的MLF中的磁化强度的反转很大程度上受到膜中结构缺陷的影响。

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