Examination of line crossings by atomic force microscopy.

摘要

Until now, the most widely used methods for the forensic examination of line crossings in documents were optical and electron microscopy. The combination of both techniques allows one in most cases to establish the sequence of lines. The recent development of scanning probe microscopy [1] gives an opportunity to complement or even replace the classical instruments used in this field. Scanning probe microscopes have been designed to study surfaces at high magnification. The aim of this study was to verify if their most popular member, the atomic force microscope (AFM) [2], can be applied to line crossing problems. The results show for the first time that AFM images present the same qualitative information obtained by scanning electron microscope (SEM) images and, consequently, allow the determination of the line crossing sequence under ambient conditions without vacuum and conductive coating of specimens.