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Particle Size Distributions: Dynamic Image Analysis Beats Laser Diffraction in a Micron to Millimeter Range

机译:粒度分布:动态图像分析击败了微米到毫米范围内的激光衍射

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摘要

Laser diffraction is the most frequently used measurement technique for the analysis of particle size distributions in the range 1 micron to 1 mm in the context of quality control. Modern laser diffraction systems offer some convincing advantages such as short measurement times, easy operation and reproducible analysis results. However, they also have various disadvantages: Even if the instruments have been calibrated and validated, an absolute particle size measurement is not possible. Various round robin tests have shown that the analysis results depend strongly on the type of instrument and even on the particular model and software version. Dynamic image Processing is an established method for size and shape analysis of free flowing, dispersed particles with hundreds of customers and applications all over the world. With the help of the latest camera technology the method is now available also for particle sizes from 1 micron, to 3 mm, a size range which was previously covered exclusively by laser diffraction. The same advantages are now available for fine powders as well as for larger particles: reliable detection of over-size, high resolution and excellent reproducibility of the particle size results, information about particle shape, as well as easy operation, short measuring times, and an intuitive, simple measuring principle. Indirect methods with limited accuracy, such as laser diffraction but also complex optical methods with unreliable statistics, such as microscopy, become increasingly outdated.
机译:在质量控制范围内,激光衍射是用于分析1微米至1毫米范围内粒度分布的最常用测量技术。现代激光衍射系统具有令人信服的优势,例如测量时间短,操作简便和分析结果可重复。但是,它们也有许多缺点:即使对仪器进行了校准和验证,也无法进行绝对粒度测量。各种循环测试表明,分析结果在很大程度上取决于仪器的类型,甚至取决于特定的型号和软件版本。动态图像处理是一种用于自由流动,分散颗粒的尺寸和形状分析的既定方法,在全球拥有数百家客户和应用程序。借助最新的相机技术,该方法现在还适用于1微米至3毫米的粒径,该粒径范围以前仅由激光衍射法覆盖。现在,细粉和较大的颗粒都具有相同的优点:可靠地检测超大尺寸,高分辨率和优异的颗粒结果重现性,有关颗粒形状的信息,并且操作简便,测量时间短,直观,简单的测量原理。精度有限的间接方法(例如激光衍射)以及统计方法不可靠的复杂光学方法(例如显微镜)变得越来越过时。

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