The Secondary Electron Yield for High-Energy Proton Bombardment on Aluminum Target

摘要

The phenomenon of secondary electron emission was discovered in the beginning of the 20th century.It is well known that there are two mechanisms contributing to the secondary electron emission,potential emission and kinetic emission.The former may proceed in front of the surface either by Auger neutralization or by resonance neutralization following Auger deexcitation when the potential energy of the projectile is two times larger than that of the work function.The latter is more important than the former in the MeV range of projectile energies.It is dominant in many ion-beam analyses since they are usually performed with MeV ion beams.