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首页> 外文期刊>Geochimica et Cosmochimica Acta: Journal of the Geochemical Society and the Meteoritical Society >Forsterite surface composition in aqueous solutions: A combined potentiometric, electrokinetic, and spectroscopic approach
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Forsterite surface composition in aqueous solutions: A combined potentiometric, electrokinetic, and spectroscopic approach

机译:水溶液中的镁橄榄石表面成分:电位,电动和光谱相结合的方法

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Surfaces of natural and synthetic forsterite (Fo(91) and Fo(100)) in aqueous solutions at 25 degrees C were investigated using surface titrations in batch and limited residence time reactors, column filtration experiments, electrokinetic measurements (streaming potential and electrophoresis techniques), Diffuse Reflectance Infrared Spectroscopy (DRIFT), and X-ray Photoelectron Spectroscopy (XPS). At pH < 9, a Mg-depleted, Si-rich layer (<20 Angstrom thick) is formed on the forsterite surface due to a Mg2+ <----> H+ exchange reaction. Electrokinetic measurements yield a pH(IEP) value of 4.5 corresponding to the dominance of SiO2 in the surface layer at pH < 9. In contrast, surface titrations of fresh powders give an apparent pH(PZC) of about 10 with the development of a large positive charge (up to 10(-4) mol/m(2) or 10 C/m(2)) in the acid pH region. This may be explained by penetration of H+ into the first unit cells of forsterite surface. The surface charge of acid-reacted forsterite is one or two orders of magnitude lower than that of unreacted forsterite with an apparent pH(PZC) at around 6.5 and a pH(IEP) value of 2.1 which is close to that for amorphous silica and reflects the formation of a silica-rich layer on the surface. XPS analyses indicate the penetration of hydrogen into the surface and the polymerization of silica tetrahedra in this leached layer. At pH > 10, a Si-deficient, Mg-rich surface layer is formed as shown by XPS analyses and the preferential Si release from the surface during column filtration experiments. Copyright (C) 2000 Elsevier Science Ltd. [References: 56]
机译:使用分批和有限停留时间反应器中的表面滴定,柱过滤实验,电动测量(流动电势和电泳技术),研究了25°C下天然和合成镁橄榄石(Fo(91)和Fo(100))在水溶液中的表面。 ,漫反射红外光谱(DRIFT)和X射线光电子能谱(XPS)。在pH <9时,由于Mg2 + <----> H +交换反应,在镁橄榄石表面上形成了贫Mg的富Si层(<20埃厚)。电动测量得出的pH(IEP)值为4.5,对应于pH <9时表面层中SiO2的含量。相反,新鲜粉末的表面滴定产生的表观pH(PZC)为约10在酸性pH范围内带正电荷(高达10(-4)mol / m(2)或10 C / m(2))。这可以通过将H +渗入镁橄榄石表面的第一个晶胞中来解释。酸反应镁橄榄石的表面电荷比未反应镁橄榄石的表面电荷低一个或两个数量级,其表观pH(PZC)约为6.5,pH(IEP)值为2.1,与无定形二氧化硅接近,反映出在表面上形成富含二氧化硅的层。 XPS分析表明,氢渗透到该表面中,并且二氧化硅四面体在该浸出层中发生聚合。在pH> 10时,如XPS分析所示,会形成缺乏Si的富Mg的表面层,并在柱过滤实验期间从表面优先释放Si。版权所有(C)2000 Elsevier Science Ltd. [参考:56]

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