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首页> 外文期刊>Experiments in Fluids: Experimental Methods and Their Applications to Fluid Flow >OPTICAL MEASUREMENT OF LIQUID FILM THICKNESS AND WAVE VELOCITY IN LIQUID FILM FLOWS
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OPTICAL MEASUREMENT OF LIQUID FILM THICKNESS AND WAVE VELOCITY IN LIQUID FILM FLOWS

机译:液膜流动中液膜厚度和波速的光学测量

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Two optical techniques are described for measurement of a liquid film's surface. Both techniques make use of the total internal reflection which occurs at a liquid-vapor interface due to the refractive index difference between a liquid and a vapor. The first technique is used for film thickness determination. A video camera records the distance between a light source and the rays which are reflected back from the liquid-vapor interface. This distance can be shown to be linearly proportional to film thickness. The second technique measures surface wave velocities. Two photo sensors, spaced a fixed distance apart, are used to record the time varying intensity of light reflected from the liquid-vapor interface. The velocity is then deduced from the time lag between the two signals. [References: 7]
机译:描述了两种用于测量液膜表面的光学技术。两种技术都利用由于液体和蒸气之间的折射率差而在液体-蒸气界面处发生的全内反射。第一种技术用于确定膜厚。摄像机记录光源与从液-气界面反射回来的光线之间的距离。可以证明该距离与薄膜厚度成线性比例。第二种技术测量表面波速度。两个以固定距离隔开的光电传感器用于记录从液-气界面反射的光的时变强度。然后从两个信号之间的时间间隔推导出速度。 [参考:7]

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