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Development of a Micro-beam Method to Investigate the Fatigue Crack Growth Mechanisms of Submicron-scale Cracks

机译:研究亚微米级裂纹疲劳裂纹扩展机理的微束方法的发展

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摘要

In this paper, we propose a new experimental method to investigate the fatigue crack growth mechanisms of submicron-scale cracks by using freestanding single edge notched micro-beams that are fabricated on the surfaces of conventional bending specimens with the focused ion beam technique. Three dimensional FEM simulations in conjugate with LEFM fracture analysis were carried out to correlate the applied far field stresses with the local crack-tip driving force. For the validation of the new method, micro-beam experiments were conducted on 4340 low alloy steels and the results showed the similar findings compared to those in the literature while revealed undiscovered fatigue damage mechanisms that took place at the submicron and nanometer scales.
机译:在本文中,我们提出了一种新的实验方法,该方法通过使用聚焦离子束技术在传统弯曲试样的表面上制造的独立式单边缺口微束来研究亚微米级裂纹的疲劳裂纹扩展机制。与LEFM断裂分析相结合进行了三维有限元模拟,以将施加的远场应力与局部裂纹尖端驱动力相关联。为了验证该新方法,对4340种低合金钢进行了微束实验,结果表明与文献相比有相似的发现,同时揭示了亚微米和纳米尺度上未发现的疲劳损伤机理。

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