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Deposition of II-VI Thin Films by LP-MOCVD Using Novel Single-Source Precursors

机译:使用新型单源前体通过LP-MOCVD沉积II-VI薄膜

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Thin films of several zinc or cadmium chalcogenides have been deposited on glass substrates by low pressure metal-organic chemical vapour deposition (LP-MOCVD) using single-source precursors, [M{(EPiPr_2)_2N}_2] (M = CdII, ZnII and E = S, Se). X-ray single crystal structures show that [Zn{(EPiPr_2)_2N}_2] (E = S or Se) and [Zn{(SePPh_2)_2N}_2] are tetrahedrally distorted. TGA analyses showed that the precursors are volatile, making them suitable for MOCVD studies. As-deposited films were polycrystalline as confirmed by X-ray powder diffraction (XRPD) and their morphologies were studied by scanning electron microscope (SEM).
机译:使用单源前体[M {(EPiPr_2)_2N} _2](M = CdII,ZnII)通过低压金属有机化学气相沉积(LP-MOCVD)在玻璃基板上沉积了几种锌或镉硫属化物的薄膜。和E = S,Se)。 X射线单晶结构表明[Zn {(EPiPr_2)_2N} _2](E = S或Se)和[Zn {(SePPh_2)_2N} _2]四面扭曲。 TGA分析表明,这些前体具有挥发性,因此适合进行MOCVD研究。 X射线粉末衍射(XRPD)证实了沉积的薄膜是多晶的,并通过扫描电子显微镜(SEM)研究了它们的形貌。

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