DIELECTRIC CONSTANT CHARACTERIZATION OF LARGE-AREA SUBSTRATES IN MILLIMETER WAVE BAND

摘要

A possibility of the dielectric constant e' measurement for substrates with permittivity ε = ε' + iε" without an essential restriction on their area has been shown experimentally . The method uses frequency measurement of quasioptical dielectric resonator (QDR) with two slots oriented along the QDR radius with a dielectric substrate in one of them. Taking QDR of teflon in 8mm waveband as an example it is found that measurable values of e' can ran up l