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Stability of Negative Resistance Coefficient Thermistors for Long-term Temperature Measurement

机译:长期温度测量中负电阻系数热敏电阻的稳定性

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摘要

The NTC (negative temperature coefficient) thermistor precision is significantly increased by the calibration process. The full calibration procedure process itself is sophisticated as it requires a set of calibration points when using the Steinhart-Hart equation for the linearization of the T(R) (Temperature - Resistance) characteristics. Aging and degradation processes tend to distort the metrological characteristics of the NTC thermistors. The novel method of calibration for groups of thermistors produced by the same manufacturer using the same technology is proposed in this paper. The initial calibration data acquired from the calibration results or from the manufacturer is used for approximate computations. During the additional calibration, the approximate data for the group of thermistors is adjusted using linear transformations. The result analysis for five different types of thermistors (A, B, C, D and E) revealed that the temperature measurement errors in the temperature range from 20℃ to 80℃ can be reduced by up to 10 times using the proposed method. The aging and degradation processes were investigated using the thermocycling procedure implemented with steep transitions (100℃ ... 0℃ ... 100℃). The thermistor R(T) characteristics were repeatedly measured after 1000, 2000 and 3000 thermocycles. The results revealed that statistically, the average error of the temperature measurement for the types C, D and E increased significantly after 3000 thermocycles, whereas the measurement error trend of the thermistors of types A and B was insignificant (p > 0.05).
机译:校准过程显着提高了NTC(负温度系数)热敏电阻的精度。完整的校准程序过程本身很复杂,因为在使用Steinhart-Hart方程对T(R)(温度-电阻)特性进行线性化时需要一组校准点。老化和退化过程往往会扭曲NTC热敏电阻的计量特性。本文提出了由同一制造商使用相同技术生产的热敏电阻组校准的新方法。从校准结果或制造商处获得的初始校准数据用于近似计算。在附加校准期间,使用线性变换调整热敏电阻组的近似数据。对五种不同类型的热敏电阻(A,B,C,D和E)的结果分析表明,使用该方法可以将20℃至80℃温度范围内的温度测量误差降低多达10倍。使用热循环程序研究了老化和降解过程,该程序具有陡峭的转变(100℃... 0℃... 100℃)。在1000、2000和3000个热循环后重复测量热敏电阻的R(T)特性。结果表明,从统计学上讲,C,D和E型温度测量的平均误差在3000个热循环后显着增加,而A和B型热敏电阻的测量误差趋势则微不足道(p> 0.05)。

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