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首页> 外文期刊>Engineering Optimization >OPTIMAL CLASSIFICATION OF HIGHLY-RELIABLE PRODUCTS WHOSE DEGRADATION PATHS SATISFY WIENER PROCESSES [1]
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OPTIMAL CLASSIFICATION OF HIGHLY-RELIABLE PRODUCTS WHOSE DEGRADATION PATHS SATISFY WIENER PROCESSES [1]

机译:通过降级路径满足Wiener过程的高可靠性产品的最佳分类[1]

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In a paper published recently in this journal, Yu [ 1 ] investigated the classification problem where the products' degradation paths satisfy Wiener processes. However, due to the dependence of the standard normal distributions Z{sub}i's and Z{sub}j's in the Appendix (the proof of Proposition 1), the expressions for inf{sub}(η{top}→∈Ω)P{sub}(η{top}→)(CDCR) and sup{sub}(η{top}→∈Ω)P{sub}(η{top}→) (ICDCR) in Proposition 1 of the paper cannot hold. Rather, only a lower bound of inf{sub}(η{top}→∈Ω)P{sub}(η{top}→) (CDCR) and an upper bound of sup{sub}(η{top}→∈Ω)P{sub}(η{top}→) (ICDCR) can be obtained. A consequence of this is that Tables I and II should also be corrected. The purpose of this note is to correct the mistakes.
机译:Yu [1]在最近发表在该杂志上的一篇论文中,研究了产品降解路径满足维纳过程的分类问题。但是,由于附录中标准正态分布Z {sub} i和Z {sub} j的依赖性(命题1的证明),因此inf {sub}(η{top}→∈Ω)P的表达式{sub}(η{top}→)(CD CR)和sup {sub}(η{top}→εΩ)P {sub}(η{top}→)(ICD CR)纸张无法容纳。相反,只有inf {sub}(η{top}→∈Ω)P {sub}(η{top}→)(CD CR)的下限和sup {sub}(η{top}的上限→∈Ω)P {sub}(η{top}→)(ICD CR)。这样做的结果是表I和II也应更正。本说明的目的是纠正错误。

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