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Electrical charging/discharging properties of organic memory device using cdse nanoparticles/PMMA blend as the tunneling layer

机译:使用cdse纳米颗粒/ PMMA共混物作为隧穿层的有机存储设备的充电/放电性能

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摘要

The electrical charging/discharging phenomena in organic memory based on the PMMACdSe nano-particles (NPs) blend tunneling insulator were demonstrated. The CdSe NPs multilayer could be easily fabricated by simple spin-coating process of blended solution of CdSe NPs in PMMA. Due to the hole trapping, the capacitance-voltage (C-V) characteristics exhibit a large counterclockwise hysteresis that is proportional to the gate bias sweep range. This simple fabrication method have a large memory window of 14.9 V after writing and erasing modes and a long charge retention ability over 10,000 s.
机译:演示了基于PMMACdSe纳米粒子(NPs)共混隧穿绝缘子的有机存储器中的充电/放电现象。通过简单地旋涂CdSe NPs在PMMA中的混合溶液,可以轻松地制备CdSe NPs多层膜。由于空穴陷阱,电容-电压(C-V)特性表现出较大的逆时针磁滞,该滞后与栅极偏置扫描范围成正比。这种简单的制造方法在写入和擦除模式后具有14.9 V的大存储窗口,并具有超过10,000 s的长电荷保持能力。

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