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SiO2-Tolerant Grain-Boundary Conduction in Sr- and Mg-Doped Lanthanum Gallate

机译:锶和镁掺杂没食子酸镧中的SiO2耐晶界导电性

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摘要

The effect of SiO2 impurity on the grain-boundary conduction in Sr- and Mg-doped lanthanum gallate La0.8Sr0.2Ga0.8Mg0.2O3, LSGM was studied. The grain-boundary conduction of LSGM was slightly affected, even by the addition of 500–2000 ppm SiO2, while the apparent grain-boundary resistivity was increased up to 780 times in gadolinia-doped ceria by the doping of 500–2000 ppm SiO2. The high tolerance of the grain-boundary conduction against siliceous impurity in the LSGM specimen was explained by the gathering of the acidic siliceous phase near the basic SrO component
机译:研究了SiO2杂质对掺Sr和Mg的镓酸镧La0.8Sr0.2Ga0.8Mg0.2O3,LSGM中晶界导电的影响。即使添加了500–2000 ppm的SiO2,LSGM的晶界传导也受到了轻微的影响,而通过掺杂500–2000 ppm的SiO2,掺g的二氧化铈中的表观晶界电阻率增加了780倍。 LSGM样品中晶界传导对硅质杂质的高耐受性可以通过在碱性SrO组分附近聚集酸性硅质相来解释

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