首页> 外文期刊>International Journal of Minerals,Metallurgy and Materials >Microstructure and mechanical properties of (Ti,Al,Zr)N/(Ti,AI,Zr,Cr)N films on cemented carbide substrates
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Microstructure and mechanical properties of (Ti,Al,Zr)N/(Ti,AI,Zr,Cr)N films on cemented carbide substrates

机译:硬质合金基体上(Ti,Al,Zr)N /(Ti,Al,Zr,Cr)N膜的组织和力学性能

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摘要

(Ti,Al,Zr)N/(Ti,Al;Zr,Cr)N bilayer films were deposited on cemented carbide (WC-8%Co) substrates by multi-arc ion plating (MAIP) using two Ti-Al-Zr alloy targets and one pure Cr target. To investigate the composition, morphology, and crystalline structure of the bilayer films, a number of complementary methods of elemental and structural analysis were used, namely, scanning electron microscopy (SEM), energy disperse X-ray spectroscopy (EDS), and X-ray diffraction (XRD). Adhesive strength and mechanical properties of the films were evaluated by scratch testing and Vickers microindentation, respectively. It is shown that the resulting films have a TiN-type face-centered cubic (FCC) structure. The films exhibit fully dense, uniform, and columnar morphology. Furthermore, as the bias voltages vary from -50 to -200 V, the microhardness (max. Hv_(0.01) 4100) and adhesive strength (max. > 200 N) of the bilayer films are superior to those of the (Ti,Al,Zr)N and (Ti,Al,Zr,Cr)N monolayer films.
机译:(Ti,Al,Zr)N /(Ti,Al; Zr,Cr)N双层膜通过使用两个Ti-Al-Zr的多弧离子镀(MAIP)沉积在硬质合金(WC-8%Co)衬底上合金靶和一种纯铬靶。为了研究双层膜的组成,形态和晶体结构,使用了许多元素和结构分析的互补方法,即扫描电子显微镜(SEM),能量分散X射线光谱(EDS)和X-射线衍射(XRD)。膜的粘合强度和机械性能分别通过划痕试验和维氏显微压痕评价。结果表明,所得膜具有TiN型面心立方(FCC)结构。膜表现出完全致密,均匀和柱状形态。此外,由于偏置电压在-50至-200 V之间变化,双层膜的显微硬度(最大Hv_(0.01)4100)和粘合强度(最大> 200 N)优于(Ti,Al ,Zr)N和(Ti,Al,Zr,Cr)N单层膜。

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