...
首页> 外文期刊>International Journal of Mineral Processing >Conceiving a high resolution and fast X-ray CT system for imaging fine multi-phase mineral particles and retrieving mineral liberation spectra
【24h】

Conceiving a high resolution and fast X-ray CT system for imaging fine multi-phase mineral particles and retrieving mineral liberation spectra

机译:构想出一种高分辨率,快速的X射线CT系统,用于对精细的多相矿物颗粒成像并检索矿物释放光谱

获取原文
获取原文并翻译 | 示例

摘要

Mineral liberation studies on fine particulate systems require high resolution and fast examination of a (statistically) significant number of particles. Commercial X-ray computed tomography systems allow high resolution on very small samples (say few micrometers on single particles) and only limited resolution on large particulate samples: thus they are unsuitable for fine particle liberation studies. A computed tomography system was conceived that is capable of high resolution (say micrometric or sub-micrometric) and allows imaging at once a large number of particles. It uses a detector design with a fiber optic bundle that allows enlarging the Field of View of a standard high resolution CCD in one direction. The thin particle multi-layer in a straw offers low X-ray attenuation and permits scanning with low current and voltages that in turn allows keeping small the size of X-ray focal spot and the induced geometrical un-sharpness of the projected particles. At low magnification values (i.e., with the sample close to the detector fiber optic input end) the overall resolution is controlled by CCD pixel size and the detector allows to scan more particles. At higher magnification values the detector design allows also improvements in resolutions. The system allows studying directly in 3D those liberation problems that require micrometer-size resolution.
机译:细颗粒系统上的矿物释放研究需要高分辨率并快速检查(统计上)大量颗粒。商业X射线计算机断层扫描系统允许在很小的样品上实现高分辨率(例如单个颗粒上只有几微米),而在大颗粒样品上只能实现有限的分辨率:因此,它们不适合用于细颗粒的释放研究。设想了一种计算机断层摄影系统,该系统能够进行高分辨率(例如,微米级或亚微米级),并且可以一次成像大量颗粒。它使用带有光纤束的检测器设计,可以在一个方向上扩大标准高分辨率CCD的视场。秸秆中的多层薄颗粒提供了低的X射线衰减,并允许以低电流和低电压进行扫描,从而可以使X射线焦点的尺寸保持较小,并避免投射颗粒的几何不清晰度。在低放大倍率值下(即样品靠近检测器光纤输入端时),总分辨率由CCD像素大小控制,检测器允许扫描更多粒子。在较高的放大倍数下,探测器的设计还可以提高分辨率。该系统允许直接在3D中研究那些需要微米级分辨率的解放问题。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号