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首页> 外文期刊>Journal of communications technology and electronics >Investigation of planar photodiodes of a focal plane array based on a heteroepitaxial InGaAs/InP structure
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Investigation of planar photodiodes of a focal plane array based on a heteroepitaxial InGaAs/InP structure

机译:基于异质外延InGaAs/InP结构的焦平面阵列平面光电二极管研究

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摘要

The results of investigation of planar photodiodes (PDs) in a focal plane array (FPA) based on a heteroepitaxial InGaAs/InP structure are reported. The FPA has a size of 320 x 256 elements with a pitch of 30 mu m, which are hybridized with various ROIC readout circuits. It is demonstrated that the PD reverse bias should be no lower than 2 V in order to suppress the FPA intercoupling at the room temperature. It is found that the dark current may be reduced considerably by cooling the FPA to-20A degrees D with a two-stage thermoelectric cooler. The best average room-temperature dark current over the FPA planar photodiodes is 0.22 pA at an optimum PD bias of-2.4 V.
机译:报道了基于异质外延InGaAs/InP结构的焦平面阵列(FPA)平面光电二极管(PDs)的研究结果。FPA 的尺寸为 320 x 256 个晶片,间距为 30 μ m,与各种 ROIC 读出电路杂交。结果表明,PD反向偏置应不低于2 V,以抑制室温下的FPA互耦。研究发现,使用两级热电冷却器将FPA冷却至-20A度D可以大大降低暗电流。FPA平面光电二极管的最佳平均室温暗电流为0.22 pA,最佳PD偏置为-2.4 V。

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