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INTERBAND TRANSITIONS AND PHONON SPECTRA OF SI-DOPED B12P2

机译:SI掺杂B12P2的带间跃迁和声子谱

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Optical absorption and FT Raman spectra of polycrystalline B12P2 prepared by CVD on silicon substrates are presented, The silicon content is rather high, and me assume that a ternary compound with the structure formula B-12(P-2)(1-x)(Si-2)(x) is formed, The absorption edge yields indirectly allowed transitions at 1.62, 1.80, 2.17, 2.46, and 2.75 eV, the energies of which are considerably lower than those reported by G. A. Slack et al. (1983, J. Phys. Chem. Solids 44, 1009) for pare B12P2. Six gap-state related transitions have ionization energies, which agree with those of electron traps in beta-rhombohedral boron, The number of one-phonon resonance frequencies agrees exactly with that predicted from group theory, The two-phonon spectra are quantitatively determined, Strong luminescence radiation superimposes the FT Raman spectrum, which differs qualitatively from that traditionally measured, This difference is explained by fluctuating distortions of the icosahedra related to the strong optical excitation of trapped electrons. (C) 1997 Academic Press. [References: 22]
机译:提出了用CVD法在硅衬底上制备的多晶B12P2的光吸收和FT拉曼光谱,硅含量很高,我假设结构式为B-12(P-2)(1-x)(形成了Si-2)(x),吸收边缘间接产生了在1.62、1.80、2.17、2.46和2.75 eV处的跃迁,其能量远低于GA Slack等人报道的能量。 (1983,J. Phys。Chem。Solids 44,1009)中的B12P2。六个与能隙状态相关的跃迁具有电离能,其与β-菱形六面体硼中的电子陷阱相符。一个声子的共振频率与基团理论预测的频率完全一致,两个声子的光谱被定量确定,强发光辐射叠加了FT拉曼光谱,该光谱与传统测得的光谱在质量上有所不同。这一差异可以通过与被捕获电子的强光激发有关的二十面体的波动畸变来解释。 (C)1997学术出版社。 [参考:22]

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