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首页> 外文期刊>International Journal of Precision Engineering and Manufacturing >Implementation of capacitive probes for ultra-high precision machine for cylindricity measurement with nanometre level of accuracy
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Implementation of capacitive probes for ultra-high precision machine for cylindricity measurement with nanometre level of accuracy

机译:用于超高精度圆柱度测量的超高精度机器的电容式探针的实现

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摘要

Capacitive probes are widely used on new ultra-high precision machines to perform measurements with an uncertainty of few nanometres, especially for cylindricity measuring machines. For this reason, their insitu calibration has to be carried out by using a specific structure. Therefore, a preliminary high precision set-up has been designed and manufactured to investigate the behaviour and the implementation of the capacitive probes. Both the number and the locations of the capacitive probes in the set-up are presented and detailed, to justify how they minimize the homogenous thermal expansion effects. The experimental set-up allows validating the insitu calibration principle of the capacitive probes with regard to the laser interferometers. The recorded residual errors are about 2 nm over the 80 A mu m-travel range. The effect of a transverse offset of the capacitive probe from the cylinder's generatrix has been investigated both experimentally and theoretically, as well as they present a good agreement.
机译:电容式探头广泛用于新型超高精度机器上,以几纳米的不确定度执行测量,尤其是圆柱度测量机。因此,必须使用特定的结构进行原位校准。因此,已经设计和制造了一种初步的高精度装置,以研究电容式探头的性能和实现。介绍并详细介绍了设置中电容式探头的数量和位置,以证明它们如何最大程度地减少了均匀的热膨胀效应。实验设置允许验证相对于激光干涉仪的电容式探头的原位校准原理。在80 Aμm行程范围内,记录的残留误差约为2 nm。实验和理论上已经研究了电容式探头相对于圆柱母线的横向偏移的影响,并且它们表现出良好的一致性。

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