Probing nanoscale thin films by phase sensitive neutron reflectometry: a simulation study

摘要

Neutron reflectometry is a powerful tool for research in nanostructure materials. It is a powerful technique for investigating surfaces and interfaces, thin films, nanostructure materials, biomembranes and magnetic films. Here, by a simulation model, we show that how it can be used to probe the nano material thin films. It is shown that by knowing the information of the complex reflection coefficient, the data analysing of neutron reflectivity leads to find the components of any thin film and their thicknesses.