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机译:Impact of Oxygen Vacancy Ordering on the Formation of a Conductive Filament in $hbox{TiO}_{2}$ for Resistive Switching Memory
Department of Materials Science and Engineering, Stanford University, Stanford , CA, USA;
$ hbox{TiO}_{2}$; Conductive filament; Vienna Ab initio Simulation Package; first principle; oxygen vacancy; resistive random access memory (ReRAM);