A Technique for Preparing Samples of Metal Nanowires for Electron and Atomic-Force Microscopy

摘要

Methods for preparing nanowire samples for experiments with transmission electron and atomic-force microscopes are described. In the method used for transmission electron microscopy investigations, metal is electrochemically deposited into etched channels of a track membrane kept close against the end surface of a thin metal foil. A method for forming nanowires in a slit of a thin epoxy film is proposed for atomic-force microscopy examinations.