Methods for studying radiation-caused damage of plastic scintillators are considered. It is shown that, in addition to conventional measurements of light yields and absorption spectra, emission spectra also contain valid information on scintillation processes and radiative damage mechanisms. A method for increasing the spectrograph spectral sensitivity when recording low-intensity emission of scintillator films with a thickness of several microns is proposed and substantiated. This technique provides a 20-fold gain.
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