Design of Virtual Integrated Test System Based on USB

摘要

Virtual Instrumentation (VI) has been widely adopted in test and measurement areas. It has gradually increased applications through continuous LabVIEW innovation and hundreds of measurement hardware devices. Making use of virtual instrumentation technology, a Virtual Integrated Test System (VITS), composed of Oscilloscope, Signal Generator and Transistor Curve Tracer, is presented in this paper. The VITS combines virtual instrument software platform LabVIEW and related hardware based on C8051F320 integrated a complete Full/Low Speed USB function for USB peripheral implementations. This system realizes many functions, including parameters measuring, data acquisition, data storage, data processing according to users' setting. Experimental results show that this system has such character as low cost, modularization, strong extensibility, very practicality and reliability. Thus, the design has a wide prospect for application.