首页> 外文期刊>Infrared physics and technology >Reprint of 'Mid-infrared InAsSb-based nBn photodetectors with AlGaAsSb barrier layers - grown on GaAs, using an interfacial misfit array, and on native GaSb'
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Reprint of 'Mid-infrared InAsSb-based nBn photodetectors with AlGaAsSb barrier layers - grown on GaAs, using an interfacial misfit array, and on native GaSb'

机译:重印“带有AlGaAsSb阻挡层的基于InAsSb的中红外nbn光电探测器-生长在GaAs上,使用界面失配阵列以及在天然GaSb上”

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InAsSb-based nBn photodetectors were fabricated on GaAs, using the interfacial misfit (IMF) array growth mode, and on native GaSb. At -0.1 V operating bias, 200 K dark current densities of 1.4 x 10(-5) A cm(-2) (on GaAs) and 4.8 x 10(-6) A cm(-2) (on GaSb) were measured. At the same temperature, specific detectivity (D*) figures of 1.2 x 10(16) Jones (on GaAs) and 7.2 x 10(16) Jones (on GaSb) were calculated. Arrhenius plots of the dark current densities yielded activation energies of 0.37 eV (on GaAs) and 0.42 eV (on GaSb). These values are close to the 4K bandgap. of the absorption layers (0.32-0.35 eV) indicating diffusion limited dark currents and small valence band offsets. Significantly, these devices could be used for mid-infrared focal plane arrays operating within the temperature range of cost-effective thermoelectric coolers. (C) 2014 Elsevier B.V. All rights reserved.
机译:基于InAsSb的nBn光电探测器在GaAs上使用界面失配(IMF)阵列生长模式制造,并在天然GaSb上制造。在-0.1 V工作偏压下,测得200 K暗电流密度为1.4 x 10(-5)A cm(-2)(在GaAs上)和4.8 x 10(-6)A cm(-2)(在GaSb上) 。在相同温度下,计算出1.2 x 10(16)Jones(在GaAs上)和7.2 x 10(16)Jones(在GaSb上)的比探测率(D *)值。暗电流密度的Arrhenius图得出激活能量为0.37 eV(在GaAs上)和0.42 eV(在GaSb上)。这些值接近4K带隙。吸收层(0.32-0.35eV)的角θ表示扩散限制了暗电流和小价带偏移。重要的是,这些设备可用于在经济高效的热电冷却器的温度范围内工作的中红外焦平面阵列。 (C)2014 Elsevier B.V.保留所有权利。

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