Process and quality control by X-ray analysis

摘要

X-ray analysis, through X-ray diffraction (XRD) and X-ray fluorescence (XRF), is a well-established method for process and quality control of minerals and orese. However, as Stefan Uhlig and Lutz Brugeman of Bruker AXS explain, there are new challenges for X-ray analytical systems in the area of ono-stream process control. This feature reviews current XRF/XRD methods and highlights breakthroughs in improving X-ray analysis of industrial minerals.