Scanning Spectrometer of Ferromagnetic Resonance for Analysis of the Thin Magnetic Film Parameters

摘要

An automatic scanning spectrometer of ferromagnetic resonance is presented. The spectrometer provides measuring of the distribution of the magnetic anisotropy inhomogeneity, saturation magnetization, coercivity, and other parameters on the surface of thin magnetic films. The spectrometer is completed with a set of interchangeable sensor-heads operating within the frequency range of 0.1 - 0.6GHz. Each sensor is manufactured on the basis of a microstrip resonator with integrated transistor microwave generator and detector. The locality of measurements in the range of 0.3 - 2.5 mm is determined by the resonator hole diameter. The signal to noise ratio of the heads determined for a 100 A permalloy film which is no less than 10 at the locality of measurements approx 1 mm~2 can increase substantially upon signal accumulation mode.