From the EIC

摘要

The design of next-generation RFICs remains challenging and demands innovation. In addition, with signal frequencies reaching tens of GHz, testing these circuits has created extraordinary challenges. This issue of D#x00026;T features a special issue on design and test of RFICs. This issue also includes an in-depth interview with Chris Rowen#x02014;founder, president, and CEO of Tensilica. In addition, there are four general-interest articles addressing diverse design and test issues.