首页> 外文期刊>ieee design & test of computers >Collection and analysis of microprocessor design errors
【24h】

Collection and analysis of microprocessor design errors

机译:Collection and analysis of microprocessor design errors

获取原文
获取原文并翻译 | 示例
           

摘要

abstract_textpResearch on practical design verification techniques has long been impeded by the lack of published, detailed error data. We have systematically collected design error data over the last few years from a number of academic microprocessor design projects. We analyzed this data and report on the lessons learned in the collection effort./p/abstract_text

著录项

  • 来源
    《ieee design & test of computers》 |2000年第4期|51-60|共10页
  • 作者单位

    Veris Design Inc, Mountain View, CA 94043 USA;

    Univ Michigan, Dept Elect Engn & Comp Sci, Ann Arbor, MI 48109 USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类
  • 关键词

获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号