Test development for a third-version ColdFire microprocessor

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机译：Test development for a third-version ColdFire microprocessor

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摘要

The design-for-test methodology of the MCF5307 device is described, illustrating issues faced, how solutions were derived, and results. References: 3

来源
《IEEE Design & Test of Computers Magazine》 |2000年第4期|29-37|共9页
作者
Crouch AL.; McLaurin TL.; Potter JC.Tran D.Mateja M.;
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作者单位

Motorola Inc, Semicond Prod Sector, Embedded Platform Solut, MD TX32-PL31,7700 W Parmer Lane, Austin, TX 78729, USA.;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种英语
中图分类计算技术、计算机技术;
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