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Nondestructive RAM Testing Based on Multiple Signature Comparison

机译:基于多重签名比较的无损RAM测试

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摘要

In the present article, the problem is considered of nondestructive testing of modern RAM devices by means of multiple signature comparison. It is shown that the reference signature values for each phase of a march test are determined only by the present RAM state; furthermore, the use of two kinds of signature analyzers allows performing an analysis of the testing results on completion of each phase of the test.
机译:在本文中,考虑了通过多重签名比较对现代RAM设备进行无损测试的问题。结果表明,行军测试每个阶段的参考签名值仅由当前的RAM状态决定;此外,使用两种签名分析器可以在测试的每个阶段完成时对测试结果进行分析。

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