A method of local self-diagnosis of failed components (modules and connection lines) in digital systems is designed. The method consists in determining suspected components and their related predecessors, implementation of the functions of a testing module by an operative module, determination of the path from one operative module to another by a ranking procedure, and processing and decoding of test results. These procedures are implemented by a group of operative modules of the digital system. Examples are given to illustrate the local self-diagnosis of failed components in a system with 3-dimensional cubic structure.
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