机译:Polarimetric monocular leaf normal estimation model for plant phenotyping
Mapping and Geoinformation Engineering Technion – Israel Institute of Technology||MOE Key Laboratory of Optoelectronic Imaging Technology and System Beijing Institute of Technology;
Mapping and Geoinformation Engineering Technion – Israel Institute of Technology;
MOE Key Laboratory of Optoelectronic Imaging Technology and System Beijing Institute of Technology;
Leaf orientation; Normal estimation; Polarization imaging; Reflectance model;