...
首页> 外文期刊>Atomic Spectroscopy >Study of the Spectral Interferences of Zirconium on Other Analytes in the Analysis of Nuclear Materials by CCD-based ICP-AES
【24h】

Study of the Spectral Interferences of Zirconium on Other Analytes in the Analysis of Nuclear Materials by CCD-based ICP-AES

机译:基于CCD的ICP-AES分析核材料中锆对其他分析物的光谱干扰的研究

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

The major problem of determining trace analytes in nuclear materials by inductively coupled plasma atomic emission spectrometry (ICP-AES) is the spectral interference of matrix elements such as U, Pu, Zr, Th, etc., originating from their line-rich emission spectra. Chemical of physical separation of the major matrix followed by the determination of trace metallic impurities in the raffinate. is a well-accepted protocol in the nuclear industries. However, separation involves handling of the materials which increases the chances of contamination. In this study, the spectral interferences of zirconium on the different analytical lines of 13 analytes (B, Cd, Sm, Dy, Gd, Na, Mg, Cr, Ca, V, Sn, Pb, and Ag) were evaluated to identify the interference-free lines of those elements in the presence of a Zr matrix. A charged coupled detector (CCD) was used because it offers more flexibility in the choice of additional analytical lines. The sensitivity and the detection limits of the analytical channels of the elements in the presence of a zirconium matrix were calculated. An analytical method was also developed for the determination of zirconium by ICP-AES, including identification of suitable analytical lines (343.823nm, 257.139 nm, and 272.262 nm) and their analytical performance such as sensitivity and detection limits.
机译:通过电感耦合等离子体原子发射光谱法(ICP-AES)测定核材料中痕量分析物的主要问题是基质元素(如U,Pu,Zr,Th等)的光谱干扰,这是由于它们的富谱线发射光谱引起的。对主要基质进行物理分离的化学方法,然后测定萃余液中的痕量金属杂质。是核工业公认的协议。然而,分离涉及处理材料,这增加了污染的机会。在这项研究中,评估了锆对13种分析物(B,Cd,Sm,Dy,Gd,Na,Mg,Cr,Ca,V,Sn,Pb和Ag)的不同分析线的光谱干扰,以鉴定Zr矩阵存在下这些元素的无干扰线。之所以使用电荷耦合检测器(CCD),是因为它在选择其他分析线时提供了更大的灵活性。计算了在锆基体存在下元素的分析通道的灵敏度和检测限。还开发了一种通过ICP-AES测定锆的分析方法,包括鉴定合适的分析线(343.823nm,257.139 nm和272.262 nm)及其分析性能,例如灵敏度和检测限。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号