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机译:A Modified Lasso Model for Yield Analysis Considering the Interaction Effect in a Multistage Manufacturing Line
Yonsei Univ, Dept Ind Engn, Seoul 03722, South Korea;
Tools; Loss measurement; Analytical models; Training; Linear regression; Predictive models; Data models; Semiconductor manufacturing; multistage manufacturing line; yield analysis; interaction effects; Lasso; process step distance;