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首页> 外文期刊>Applied optics >AVALANCHE PHOTODIODES AND QUENCHING CIRCUITS FOR SINGLE-PHOTON DETECTION
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AVALANCHE PHOTODIODES AND QUENCHING CIRCUITS FOR SINGLE-PHOTON DETECTION

机译:雪崩光电二极管和淬火电路,用于单光子检测

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摘要

Avalanche photodiodes, which operate above the breakdown voltage in Geiger mode connected with avalanche-quenching circuits, can be used to detect single photons and are therefore called single photon avalanche diodes SPAD's. Circuit configurations suitable for this operation mode are critically analyzed and their relative merits in photon counting and timing applications are assessed. Simple passive-quenching circuits (PQC's), which are useful for SPAD device testing and selection, have fairly limited application. Suitably designed active-quenching circuits (AQC's) make it possible to exploit the best performance of SPAD's. Thick silicon SPAD's that operate at high voltages (250-450 V) have photon detection efficiency higher than 50% from 540- to 850-nm wavelength and still similar to 3% at 1064 nm. Thin silicon SPAD's that operate at low voltages (10-50 V) have 45% efficiency at 500 nm, declining to 10% at 830 nm and to as little as 0.1% at 1064 nm. The time resolution achieved in photon timing is 20 ps FWHM with thin SPAD's; it ranges from 350 to 150 ps FWHM with thick SPAD's. The achieved minimum counting dead time and maximum counting rate are 40 ns and 10 Mcps with thick silicon SPAD's, 10 ns and 40 Mcps with thin SPAD's. Germanium and III-V compound semiconductor SPAD's extend the range of photon-counting techniques in the near-infrared region to at least 1600-nm wavelength. [References: 62]
机译:雪崩光电二极管在盖革模式下与击穿电压相连,并与雪崩猝灭电路相连接,可在击穿电压以上工作,可用于检测单光子,因此被称为单光子雪崩二极管SPAD。严格分析了适合此工作模式的电路配置,并评估了它们在光子计数和定时应用中的相对优势。对于SPAD设备测试和选择非常有用的简单无源淬火电路(PQC),其应用范围非常有限。适当设计的有源淬火电路(AQC)使利用SPAD的最佳性能成为可能。在高电压(250-450 V)下运行的厚硅SPAD具有从540-850 nm波长的光子检测效率高于50%,但在1064 nm处仍接近3%。在低压(10-50 V)下工作的薄硅SPAD在500 nm处的效率为45%,在830 nm处的效率降至10%,在1064 nm处的效率降至0.1%。使用薄SPAD时,在光子定时中实现的时间分辨率为20 ps FWHM;厚SPAD的FWHM范围为350至150 ps。对于厚硅SPAD,实现的最小计数死区时间和最大计数率分别为40 ns和10 Mcps,对薄SPAD而言,则达到10 ns和40 Mcps。锗和III-V化合物半导体SPAD将近红外区域中的光子计数技术的范围扩展到至少1600 nm波长。 [参考:62]

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