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首页> 外文期刊>Applied optics >Precise measurement of thermal-induced refractive-index change in BaTiO_(3) on the basis of anisotropic self-diffraction
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Precise measurement of thermal-induced refractive-index change in BaTiO_(3) on the basis of anisotropic self-diffraction

机译:基于各向异性自衍射的BaTiO_(3)热致折射率变化的精确测量

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摘要

We propose a method for precise measurement of the temperature-dependent refractive-index change in BaTiO_(3) by use of anisotropic self-diffraction (ASD). In this method the refractive-index change corresponds to the angle deviation of the diffraction pattern. Because only the geometry of the ASD is used for measuring, the precision of measurement is independent of crystal thickness and environmental perturbation. The accuracy of the refractive-index change achieved is 10~(-4) when the resolution of the measurement of the angle is ~0.04°. Both the theory and the experiment are demonstrated.
机译:我们提出了一种使用各向异性自衍射(ASD)精确测量BaTiO_(3)随温度变化的折射率变化的方法。在该方法中,折射率变化对应于衍射图案的角度偏差。由于仅使用ASD的几何形状进行测量,因此测量精度与晶体厚度和环境扰动无关。当角度测量的分辨率为〜0.04°时,折射率变化的精度为10〜(-4)。理论和实验都得到了证明。

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