Characterization of a Reference Test Setup for the Development of HPEM Standards

摘要

Given that intentional interference with electronic devices is not bound by legal parameter limitations, formulating standard procedures to adequately probe device immunity poses a challenge. In order to foster such developments, we further characterize a compact reference test setup conceived earlier by new parameter studies. To acquire immunity profiles in a TEM waveguide, we used narrowband pulses similar to radar. Since the error threshold field values can depend on the angle of incidence of the incoming waves, we did an extended study over different orientations of our setup, only resulting in moderate variations. Together with measurements in the previously unexplored range between 4 and 8 GHz evidencing many error occurrences, we could show the versatility of our battery-operated reference test setup based on a single board computer of the Raspberry Pi line.