Atomic force microscopy

Lab plus international Group

首页> 外文期刊>Lab plus international >Atomic force microscopy

【24h】

Atomic force microscopy

机译：原子力显微镜

获取原文

获取原文并翻译 | 示例

获取外文期刊封面封底 >>

开具论文收录证明 >>

文献代查 >>

页面导航

摘要
著录项
相似文献
相关主题

摘要

The EvniroScope atomic force microscope (AFM) combines enhanced environmental controls within a sealed hermetic sample chamber and advanced scanning technology to deliver greater application flexibility to research and industrial laboratories looking for a competitive edge.

机译：EvniroScope原子力显微镜(AFM)结合增强内环境控制密封的密封的样品室和先进扫描技术提供更大研究和应用灵活性工业实验室寻找竞争力边缘。

著录项

来源
《Lab plus international》 |2006年第4期|23-0|共1页
作者
Lab plus international Group;
展开▼
作者单位

展开▼
收录信息
原文格式 PDF
正文语种英语
中图分类 F39;
关键词
Atomic Force Microscopy; Force Microscopies; zinc oxide eugenolEnvironmental controlsIndustrial laboratoriesChambers;

机译：原子力显微镜;力显微镜;锌氧化eugenolEnvironmental controlsIndustriallaboratoriesChambers;

相似文献

外文文献
中文文献
专利

1. Atomic Force Microscopy Measurement in the Lignosulfonate/Inorganic Silica System:From Dispersion Mechanism Study to Product Design [J] . Jingyu Wang, Yong Qian, Yijie Zhou, 工程（英文） . 2021,第008期
2. Experimental use of the inflection point test for force deconvolution in frequency-modulation atomic force microscopy to turn an ill-posed situation into a well-posed one by proper choice of amplitude [J] . Ferdinand Huber, Franz J. Giessibl Journal of Applied Physics . 2020,第18期

机译：Experimental use of the inflection point test for force deconvolution in frequency-modulation atomic force microscopy to turn an ill-posed situation into a well-posed one by proper choice of amplitude
3. The Journal of Microscopy Journal of Microscopy would like to thank all those referees who reviewed papers for the Journal Journal during 2019. Your assistance and contribution to the Journal Journal is greatly appreciated [J] . Journal of Microscopy . 2019,第3期

机译：Microscopy Microscopy Chinocy的杂志希望感谢所有审查期刊期刊论文2019年期刊的裁判。您的援助和对日记期刊的贡献非常感谢
4. The Journal of Microscopy Journal of Microscopy would like to thank all those referees who reviewed papers for the Journal Journal during 2018. Your assistance and contribution to the Journal Journal is greatly appreciated [J] . Journal of Microscopy . 2018,第3期

机译：Microscopy Microscopy杂志杂志要感谢所有审查2018年期刊期刊论文的裁判。您的援助和对期刊期刊的贡献非常感谢
5. Nanomanipulation with 3D visual and force feedback using atomic force microscopes [C] . Vogl W., Sitti M., Zah M.F. IEEE Conference on Nanotechnology . 2004

机译：使用Atomic Force显微镜的3D视觉和力反馈的纳米尺寸
6. AFM-ODMR Correlation Microscopy for High Precision Measurement using Nitrogen-Vacancy Center =基於金剛石色心與原子力-光探測磁共振關聯顯微鏡的量子精密測量 [D] . Liu, Chufeng. 2020

机译：AFM-ODMR Correlation Microscopy for High Precision Measurement using Nitrogen-Vacancy Center =基于金刚石色心与原子力-光探测磁共振关联显微镜的量子精密测量
7. Using sensitivity equations for computing gradients of the FOCE and FOCEI approximations to the population likelihood [O] . Joachim Almquist, Jacob Leander, Mats Jirstrand -1

机译：使用灵敏度方程来计算FORCE和FORCE近似于总体似然的梯度
8. The asymmetric membrane structure of erythrocytes from Crucian carp studied by atomic force microscopy [O] . Tian YM, Cai MJ, Zhao WD, 2014

机译：The asymmetric membrane structure of erythrocytes from Crucian carp studied by atomic force microscopy
9. Aberration Compensation in Aplanatic Solid Immersion Lens Microscopy (Open Access, Publisher's Version). [R] . Lu, Y., Bifano, T., Unlu, S., 2013

机译：aplanatic solid Inmersion Lension Lens microscopy中的像差补偿（开放存取，出版商版）。

Atomic force microscopy

摘要

著录项

相似文献

相关主题

期刊订阅