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Investigations on TDCR measurements with the HIDEX 300 SL using a free parameter model

机译:使用自由参数模型对HIDEX 300 SL进行TDCR测量的研究

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The Triple to Double Coincidence Ratio (TDCR) method requires a special counting system with three photodetectors. The systems currently used by National Metrology Institutes for activity standardizations are custom built, and up to now the HIDEX 300 SL counter 11Manufactured by HIDEX Oy, Finland. ,22Certain commercial equipment, instruments, or materials are identified in this paper to foster understanding. Such identification does not imply recommendation by the Physikalisch-Technische Bundesanstalt, nor does it imply that the materials or equipment identified are necessarily the best available for the purpose. is the only TDCR counter commercially available.At PTB, measurements with a special metrology version of this counter were carried out to investigate its applicability for activity standardizations. The activity results of measurements with the HIDEX counter are compared to those obtained with a PTB-TDCR counter, as such a comparison reduces the model dependence. In addition, a spectrometry method was applied to measure 109Cd samples and a new TDCR-?erenkov method was tested with 32P samples.
机译:三重对偶符合率(TDCR)方法需要具有三个光电探测器的特殊计数系统。美国国家计量学会当前用于活动标准化的系统是经过定制的,到目前为止,HIDEX 300 SL计数器11由芬兰HIDEX Oy制造。 ,22本文确定了某些商用设备,仪器或材料以增进理解。这样的识别并不意味着Physikalisch-Technische Bundesanstalt的推荐,也不意味着所识别的材料或设备必然是为此目的最好的材料。在PTB,使用该计数器的特殊计量版本进行了测量,以调查其在活动标准化方面的适用性。将HIDEX计数器的测量活动结果与PTB-TDCR计数器的测量活动结果进行比较,因为这样的比较降低了模型依赖性。此外,采用光谱法测量了109Cd样品,并用32P样品测试了新的TDCR-erenkov方法。

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