Inversion-based thickness determination

摘要

We are familiar with the claim that seismic inversion improves resolution-something I routinely dismissed as advertising until an article on Alpine Field by Gingrich et al. (TIE, 2001) awakened my curiosity. That article described how impedance data were used to determine thickness and, in order to understand the reasons for the success of their impedance-based method for thickness determination, I created simple seismic models. Much to my surprise, these models substantiate the claim that impedance data allow us to directly measure thicknesses even below the "tuning thickness" that limits a similar approach with the original amplitude data.