Next Generation Benchtop SEM Series Launched

摘要

In 2005 Hitachi introduced the first commercial benchtop SEM, where high quality electron microscopy could be achieved quickly and easily by any operator. The concept was rapidly adopted by industry and academia for a wide range of fields including failure analysis, quality control, materials science and life science research, with over 3700 instruments installed. The TM4000 series is the latest generation instrument and offers more advanced SEM capabilities whilst being true to the original concept, keeping usability and time-to-data at its heart.