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Analysis of the Influence of Electrostatic Probe on Surface Charge Measurements

机译:分析静电探针对表面电荷测量的影响

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摘要

The electrostatic probe is among the most popular methods to measure the surface charge. However, the probe influences the surface charge distribution on the sample, which increases measurement error. In this paper, the electrostatic probe system is modeled to study its effect on surface charges on a circular conductor plate using electrostatic field calculation. The influence of the probe on the sample surface charges is found to increase with a decrease in the measurement distance, whereas it has a similar effect on surface charge density at different radial positions. A calibration process is proposed to measure the potential from the induced potential of the probe head. Using the measured potential, we calculate the surface charge density via the method of moments. The measurement error is analyzed when the measurement distance and number of rings are changed. The authors find that the number of rings should be appropriately reduced when the measurement distance increases to ensure the accuracy of the calculations. This research provides theoretical guidance for using the electrostatic probe and establishing a surface charge measurements system. (c) 2022 Institute of Electrical Engineers of Japan. Published by Wiley Periodicals LLC.
机译:静电探针是测量表面电荷的最流行方法之一。但是,探针会影响样品上的表面电荷分布,从而增加了测量误差。在本文中,使用静电场计算,对静电探针系统进行了建模,以研究其对圆形导体板上的表面电荷的影响。发现探针对样品表面电荷的影响会随着测量距离的降低而增加,而在不同径向位置下表面电荷密度的影响相似。提出了一个校准过程,以测量探针头的诱导电位的电势。使用测量电位,我们通过矩方法计算表面电荷密度。当更改测量距离和数量时,分析了测量误差。作者发现,当测量距离增加以确保计算的准确性时,应适当减少环数。这项研究为使用静电探针和建立表面电荷测量系统提供了理论指导。 (c)2022日本电气工程师研究所。由Wiley Wendericals LLC出版。

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